JPH0219897B2 - - Google Patents

Info

Publication number
JPH0219897B2
JPH0219897B2 JP54138215A JP13821579A JPH0219897B2 JP H0219897 B2 JPH0219897 B2 JP H0219897B2 JP 54138215 A JP54138215 A JP 54138215A JP 13821579 A JP13821579 A JP 13821579A JP H0219897 B2 JPH0219897 B2 JP H0219897B2
Authority
JP
Japan
Prior art keywords
light
excitation
measured
spectrometer
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP54138215A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5661633A (en
Inventor
Taro Nogami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13821579A priority Critical patent/JPS5661633A/ja
Publication of JPS5661633A publication Critical patent/JPS5661633A/ja
Publication of JPH0219897B2 publication Critical patent/JPH0219897B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP13821579A 1979-10-24 1979-10-24 Densitometer for measuring secondary light of developed constituent Granted JPS5661633A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13821579A JPS5661633A (en) 1979-10-24 1979-10-24 Densitometer for measuring secondary light of developed constituent

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13821579A JPS5661633A (en) 1979-10-24 1979-10-24 Densitometer for measuring secondary light of developed constituent

Publications (2)

Publication Number Publication Date
JPS5661633A JPS5661633A (en) 1981-05-27
JPH0219897B2 true JPH0219897B2 (en]) 1990-05-07

Family

ID=15216767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13821579A Granted JPS5661633A (en) 1979-10-24 1979-10-24 Densitometer for measuring secondary light of developed constituent

Country Status (1)

Country Link
JP (1) JPS5661633A (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11053591B2 (en) 2018-08-06 2021-07-06 Asm Ip Holding B.V. Multi-port gas injection system and reactor system including same
US11056344B2 (en) 2017-08-30 2021-07-06 Asm Ip Holding B.V. Layer forming method
US11056567B2 (en) 2018-05-11 2021-07-06 Asm Ip Holding B.V. Method of forming a doped metal carbide film on a substrate and related semiconductor device structures

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8513538D0 (en) * 1985-05-29 1985-07-03 Mackay C D Electrophoresis
JPH0799353B2 (ja) * 1987-03-31 1995-10-25 株式会社島津製作所 塩基配列決定装置
JP5463302B2 (ja) * 2011-01-14 2014-04-09 株式会社日立ハイテクノロジーズ 電気泳動装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5436716Y2 (en]) * 1975-04-23 1979-11-06
CA1068508A (en) * 1975-12-11 1979-12-25 John U. White Fluorescence spectrophotometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11056344B2 (en) 2017-08-30 2021-07-06 Asm Ip Holding B.V. Layer forming method
US11056567B2 (en) 2018-05-11 2021-07-06 Asm Ip Holding B.V. Method of forming a doped metal carbide film on a substrate and related semiconductor device structures
US11053591B2 (en) 2018-08-06 2021-07-06 Asm Ip Holding B.V. Multi-port gas injection system and reactor system including same

Also Published As

Publication number Publication date
JPS5661633A (en) 1981-05-27

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